Lorentz microscopy mapping during magnetization process of L10 FePd thin films

Lorentz Transmission Electron Microscopy (LTEM) allows the observation of magnetization evolution in thin magnetic layers. Electron Microscopy which enables observation at a nanometric scale is sensitive to magnetic induction perpendicular to the beam. Here we show that this technique allows the magnetization process in thin layers having perpendicular magnetic anisotropy to be studied. LTEM has been carried out on a JEOL 3010 and a FEI Titan 300kV (equipped with a Lorentz Lens). We determine how the magnetization is distributed along the domain walls (where the magnetization is in plane). Hence we could observe the evolution of a domain configuration during the magnetization process versus the orientation of its boundaries. This study is based on phase reconstruction methods and is completed by Lorentz image simulations.